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Title :Evaluation of crystalline germanium thin films electrodeposited on copper substrates from propylene glycol electrolyte
Authors :Saitou, Masatoshi
Sakae, K
Oshikawa, W
Issue Date :1-Jan-2003
Abstract :Germanium thin films electrochemically deposited at 300 K from a solution of GeCl4, in propylene glycol were investigated using X-ray diffraction (XRD), infrared (IR) spectroscopy and atomic force microscopy (AFM). XRD reveals that the germanium electrodeposits are of crystalline structure and have the preferred crystallographic growth orientation [220]. The presence of the hydrogen bonding in the germanium films such as Ge-H and Ge-H-2 is shown from the IR absorption and does not cause a phase transition from crystalline structures to amorphous structures. The AFM images exhibit anomalous surface roughening behaviors in growth that deviate from statistical surface growth models and indicate a transition from rough surfaces to smooth surfaces.
URL :http://www.sciencedirect.com/science/journal/02578972
Type Local :雑誌掲載論文
ISSN :0257-8972
Publisher :Elsevier Science B.V.
URI :http://hdl.handle.net/20.500.12000/392
Citation :Surface & Coatings Technology Vol.162 no.1 p.101 -105
Appears in Collections:Peer-reviewed Journal Articles (Faculty of Engineering)

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